Division of Design and Diagnostics of Computer Systems

RESEARCH FIELDS:

  1. Automatic testing of digital systems

    Generation of test patterns
    Compact testing
    Microcomputer signature analysis
    Built-in self-tests
    Pseudorandom techniques for built-inself-tests for VLSI circuits and design of standard P1149 comatibile chips


  2. CAD systems for digital circuit design

    Simulation CAD tools for electronics digital circuits
    Elements of expert system for CAD systems



RESEARCH GRANTS AWARDED THE COMMITTEE FOR SCIENTIFIC
RESEARCH TO STAFF MEMBERS OF THE DIVISION

  1. Application specific electronics (Design of easily and self-testing sequential systems, testing methodology of interconnections, simulation tools, elements of expert system for CAD systems )

  2. Tesing and self-testing strategy for processor systems


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